IIoT and Big Data are two significant industry trends driving the push towards predictive analytics and proactive maintenance programs. This session will be a sneak peek at some of the significant new developments in the PI System that bring together IIoT devices, edge processing, and big data analytics to help customers achieve the new predictive agenda. Come and see how we�re enhancing the PI System to provide connectivity directly into smart devices, data collection through industrial grade gateway modules, simple configuration methods for creating analytical context, and data shapes that feed your predictive analytics projects and big data initiatives.
John Baier is the Director of Integration Technologies at OSIsoft. In his role, John and his team develop products that connect to hundreds of source systems spanning multiple industries to collect data in the PI System. His team also works on products that integrate PI System data with enterprise business systems so that customers can make great decisions in real time. John came to OSIsoft in 2009 after 23 years at Rockwell Automation, where he held a variety of roles in software engineering, engineering management, business management, and software architecture. He is the inventor on over a dozen US Patents in the area of plant floor information management and factory controls. John holds a Bachelor of Science in Computer Science from Bowling Green State University.